Electronics Test and Measurement

- for summaries, information, tutorials and data about electronics test and measurement techniques and electronic test and measurement equipment from ICT to boundary scan / JTAG and GPIB to instruments including automatic test equipment, spectrum analyzers, logic analyzers and oscilloscopes.

There is plenty of terminology associated with electronics test and measurement and automatic test. Our terminology glossary explains the most commonly used terms:

Glossary: [ A - D ] , [ E - H ] , [ I - P ] and [ Q - Z ]

Electronic testing technologies and methodologies

Testing and test equipment are essential elements for the electronics industry. Not only is the test equipment important, but so are the methodologies and test techniques used. Below are some of the test equipment and test methodologies that can be used.

• ATE automatic test equipment basics including AOI, AXI, ICT, FATE, etc
• Boundary Scan (JTAG / IEEE 1149) Tutorial
• Design for test, DFT
• GPIB basics tutorial
• Basics of data acquisition
• Basics of EMC / EMI compliance test
• Basics of environmental stress screening (ESS) including HALT, HASS
• LXI test technology basics
• PXI and PXI EXpress tutorials
• VXIbus for high speed integrated test systems

Electronic test equipment summaries

There is a wide variety of electronic test equipment that is used within radio and electronics today. There is a large variety of electronic test equipment that is used in production, development, field test and general fault finding.

• Arbitrary waveform generator
• DC power supply specifications
• Digital multimeter, DMM basics
• Oscilloscope tutorial
• Logic analyzer basics
• Frequency counter basics
• Function generator
• Radio frequency signal generators
• Spectrum analyzer tutorial
• RF network analyzer basics tutorial
• RF power meter basics

- Test equipment calibration - why and how test equipment is calibrated
- Used test equipment - advantages and disadvantages of buying second user test equipment