Navigation:: Home >> Test and measurement >> this page

ATE Glossary [Q - Z]


Glossary pages: [ A - D ] , [ E - H ] , [ I - P ] and [ Q - Z ],/center>

 

Quantising Error – The uncertainty that exists in an analogue to digital conversion resulting from the finite steps between adjacent digital representations. Increasing the resolution of the ADC reduces the error.

Repeatability – The ability of an test instrument or test system to be able to provide the same result when a test is repeated with the same UUT. Poor repeatability is a problem that requires attention in any test system, and may arise from stray pick up, inconsistent contact between the UUT and the fixture, etc.

SCPI – Standard Computer Programming Interface. It originated with the use of GPIB and it defines a standard set of commands to control programmable test and measurement devices in instrumentation systems.

Settling Time – The time required after a change for a circuit or test instrument to reach its steady state.

STDF – Standard Test Data Format. A data format in which test system can output data. The idea was developed to create common standards and allow data to be interchanged more easily, thereby simplifying processing. Unfortunately many interpretations of the standard exist and it is necessary to ensure compatibility before use.

STIL – Standard Test Interface Language. An emerging standard encompassed by IEEE working group 1450.

Stimulus – An input signal, which may be an input voltage, digital bit pattern, etc that is used to excite a UUT, and stimulate a response which is measured or detected at the output.

Test Specification – The document that defines the specific tests with conditions that are applied to the UUT.

Throughput – The number of items that can be processed in a given time.

UUT – Unit Under Test. The target item that is being tested.

Yield – The proportion of good items that are produced by a manufacturing system.









computer storage overview enterprise Frank Förster | Intel Programmable Solutions Group
IoT-driven data deluge: Why FPGAs will play a central role
Huge amounts of data are starting to be generated by the Internet of Things: dealing with this data deluge requires a new approach to computing and FPGAs will play a central role.
Whitepapers
Bringing the Internet of Things to Life
Silicon Labs looks at the fact that industry experts predict that the number of connected devices for the Internet of Things (IoT) will surpass 15 billion nodes by 2015 and reach over 50 billion by 2020. Learn how to overcome the challenges of connecting intelligent nodes to the Internet of Things.

More whitepapers










Radio-Electronics.com is operated and owned by Adrio Communications Ltd and edited by Ian Poole. All information is © Adrio Communications Ltd and may not be copied except for individual personal use. This includes copying material in whatever form into website pages. While every effort is made to ensure the accuracy of the information on Radio-Electronics.com, no liability is accepted for any consequences of using it. This site uses cookies. By using this site, these terms including the use of cookies are accepted. More explanation can be found in our Privacy Policy