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ATE Glossary [E - H]


Glossary pages: [ A - D ] , [ E - H ] , [ I - P ] and [ Q - Z ]

 

ESS - Environmental Stress Screening. A process where an assembly is subjected to rapidly changing temperatures and possibly vibration in an attempt to bring out any latent defects during the production process rather than allow them to occur once in service.

FATE - Functional Automatic Test Equipment. An automatic test equipment that tests the operation of the UUT.

Fault - An imperfection in a UUT that prevents it from operating satisfactorily.

Fault Coverage - A measure of the degree to which a test fulfils its requirements. It is a figure indicating the percentage of faults that can be found by a test.

Fault Dictionary - A database of faults that can be used by a simulator to help determine the fault coverage. A fault dictionary may also be used by diagnostic system to help analyse faults when trying to diagnose problems.

Fault Equivalence - Two faults are referred to as being equivalent if the effect they have on the output is the same.

Fault Signature - A given set of failure indications (e.g. readings on different pins of a UUT) that are produced by a given fault.

Fault Simulation - This is the simulation of a UUT under fault conditions that may occur.

FIT - Fault Isolation Test. A test used to identify and locate a fault.

Functional Test - A form of test that focuses on exercising the UUT and checking its operation or functionality. Analogue measurements may be made as required to ensure they are within specification.

Go/No-go Test - A form of test that only returns a pass or fail, i.e. Go or No-go. They do not return any failure reports or provide any diagnostics.

GPIB - General Purpose Interface Bus. Originally known as HP-IB (Hewlett Packard Interface Bus) and also defined as IEEE 488, this bus is used for communicating between devices. One of its main uses is for automatic test applications where a computer is used to control a number of test instruments.

Guarding - A process often used in In-Circuit and other forms of test that ensures that a shunt path does not interfere with a measurement. It is achieved by forcing nearby nodes to a given voltage, often virtual earth.

Guided Probe - A techniques used in diagnostic testing where an operator is prompted to place a moving probe onto a given point in the circuit to make a diagnostic measurement.

HALT - Highly Accelerated Life Test. A form of life test performed during the development of a product to highlight any design weaknesses that would reduce the reliability and the life of a product.

HAST - Highly Accelerated Stress Screening. A form of ESS where the conditions applied to the target assembly to enable the stress screening process to be rapid.









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